Title :
1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)
Abstract :
The following topics were dealt with: CMOS devices and technology; integrated processor systems; interconnects and synthesis; oxide and CMOS reliability; high-performance circuits for microprocessors and FPGA; process technology; wireless circuits; communication circuits; flash technology; IC testing, test structures and fault detection; CMOS analog and sensor circuits; advanced memory technology; SOI circuits; low-voltage CMOS circuits
Keywords :
CMOS integrated circuits; VLSI; field programmable gate arrays; flash memories; integrated circuit interconnections; integrated circuit reliability; integrated circuit technology; integrated circuit testing; integrated memory circuits; low-power electronics; microprocessor chips; silicon-on-insulator; telecommunication equipment; CMOS analog circuits; CMOS devices; CMOS reliability; CMOS technology; FPGA; IC testing; SOI circuits; VLSI technology; advanced memory technology; communication circuits; fault detection; flash technology; high-performance circuits; integrated processor systems; interconnects; low-voltage CMOS circuits; microprocessors; oxide reliability; process technology; sensor circuits; test structures; wireless circuits;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1999. International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-5620-9
DOI :
10.1109/VTSA.1999.785983
