Title :
Base-collector design optimisation of InGaP/GaAs DHBTs
Author :
Rezazadeh, A.A. ; Sotoodeh, M. ; Dharmasiri, N.
Author_Institution :
Dept. of Electron. Eng., King´´s Coll., London, UK
Abstract :
In this paper we present the design and realisation of DHBTs based on InGaP/GaAs and compare the performance of these devices with the standard single HBT (SHBT). Optimisation of these devices in terms of base/collector electron collection efficiency is also discussed using the base and collector transit times, τB and τC , deduced from the phase and magnitude of the common-base current gain, α(ω), which itself was directly extracted from measured S-parameter data. The method is applied to InGaP/GaAs single and double HBTs. A smaller cut-off frequency in the latter device is attributed to τB and τC due to two effects: trapping of electrons in the conduction band triangular barrier existing at the base-collector (B-C) heterojunction and smaller saturation velocity of electrons in InGaP as compared to GaAs. Finally, a new B-C design of InGaP/GaAs DHBTs is proposed to partially compensate the transit time effects. Numerical simulation of the cut-off frequency demonstrates the superiority of the proposed structure for high frequency applications
Keywords :
III-V semiconductors; S-parameters; gallium arsenide; heterojunction bipolar transistors; indium compounds; InGaP-GaAs; InGaP/GaAs DHBT; S-parameter; base-collector design optimisation; conduction band triangular barrier; current gain; cut-off frequency; electron collection efficiency; electron saturation velocity; electron trapping; numerical simulation; transit time; Current measurement; Cutoff frequency; Data mining; Design optimization; Double heterojunction bipolar transistors; Electrons; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Phase measurement;
Conference_Titel :
High Performance Electron Devices for Microwave and Optoelectronic Applications, 2000 8th IEEE International Symposium on
Conference_Location :
Glasgow
Print_ISBN :
0-7803-6550-X
DOI :
10.1109/EDMO.2000.919040