Title :
The Design and Application of I2C Bus in the TD-LTE Comprehensive Test Instrument
Author :
Fatang, Chen ; Linyu, Yang
Author_Institution :
Chongqing Key Lab. of Mobile Commun., Chongqing Univ. of Posts & Telecommun., Chongqing, China
Abstract :
Based on the development platform of the TD-LTE Comprehensive Test Instrument, to enable the system to adapt to the needs of a variety of configurations and be more flexible, the paper proposes a method of transferring the control information by I2C Bus from DSP to FPGA, then implementing I2C slave interface in FPGA. The experimental simulations show the correction of I2C interface. In the end, the paper proposes an optimized program.
Keywords :
Long Term Evolution; digital signal processing chips; field programmable gate arrays; DSP; FPGA; I2C bus; I2C slave interface; TD-LTE comprehensive test instrument; Digital signal processing; Field programmable gate arrays; Hardware; Instruments; Software radio; Timing; Writing; DSP; FPGA; I2C; TD-LTE;
Conference_Titel :
Business Computing and Global Informatization (BCGIN), 2011 International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-0788-9
Electronic_ISBN :
978-0-7695-4464-9
DOI :
10.1109/BCGIn.2011.165
