DocumentCode :
3067171
Title :
Necessary and sufficient conditions for high-dimensional salient feature subset recovery
Author :
Tan, Vincent Y F ; Johnson, Matthew ; Willsky, Alan S.
Author_Institution :
Stochastic Syst. Group, MIT, Cambridge, MA, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
1388
Lastpage :
1392
Abstract :
We consider recovering the salient feature subset for distinguishing between two probability models from i.i.d. samples. Identifying the salient set improves discrimination performance and reduces complexity. The focus in this work is on the high-dimensional regime where the number of variables d, the number of salient variables k and the number of samples n all grow. The definition of saliency is motivated by error exponents in a binary hypothesis test and is stated in terms of relative entropies. It is shown that if n grows faster than max{ck log((d-k)/k), exp(c´k)} for constants c, c´, then the error probability in selecting the salient set can be made arbitrarily small. Thus, n can be much smaller than d. The exponential rate of decay and converse theorems are also provided. An efficient and consistent algorithm is proposed when the distributions are graphical models which are Markov on trees.
Keywords :
Markov processes; computational complexity; information theory; set theory; trees (mathematics); Markov; binary hypothesis test; discrimination performance; error exponents; error probability; graphical models; high-dimensional salient feature subset recovery; probability models; relative entropies; salient set; Decoding; Entropy; Error probability; Graphical models; Pediatrics; Probability distribution; Stochastic systems; Sufficient conditions; Testing; Tree graphs; Binary hypothesis testing; Error exponents; High-dimensional; Salient feature subset; Tree distributions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7890-3
Electronic_ISBN :
978-1-4244-7891-0
Type :
conf
DOI :
10.1109/ISIT.2010.5513598
Filename :
5513598
Link To Document :
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