DocumentCode :
3067535
Title :
Study of electrical and optical properties of InGaN/AlGaN double heterostructure blue light emitting diodes
Author :
Shen, B. ; Shi, H.T. ; Yang, K. ; Chen, Z.Z. ; Zhou, Y.G. ; Chen, P. ; Zhang, R. ; Zheng, Y.D.
Author_Institution :
Dept. of Phys., Nanjing Univ., China
fYear :
1998
fDate :
1998
Firstpage :
689
Lastpage :
692
Abstract :
The electrical and optical properties of double heterostructure blue light-emitting diodes, with an In0.06Ga0.94N:Zn,Si active layer, made by Nichia Ltd., were investigated at various temperatures. Measurement of the forward bias current-voltage behavior of the device demonstrates a departure from the Shockley model of p-n diodes, and it is observed that the dominant mechanism of carrier transport across the junction is associated with carrier tunneling. Electroluminescence experiments of the devices indicates that there is an emission peak located at 2.80 eV, and a relatively weaker short-wavelength peak at 3.2 eV. A significant blue shift of the optical emission peak, consistent with the tunneling character of electrical characteristics, was observed. Furthermore, we studied the properties of electroluminescence under various pulsed currents, and a degradation in I-V characteristics and a low resistance ohmic short were observed
Keywords :
III-V semiconductors; aluminium compounds; electroluminescence; gallium compounds; indium compounds; light emitting diodes; semiconductor epitaxial layers; spectral line shift; tunnelling; I-V characteristics; In0.06Ga0.94N:Zn,Si; InGaN-AlGaN; blue shift; carrier tunneling; double heterostructure blue LED; electroluminescence; forward bias current-voltage behavior; pulsed currents; Aluminum gallium nitride; Current measurement; Electric variables; Electroluminescence; Electroluminescent devices; Light emitting diodes; P-n junctions; Stimulated emission; Temperature measurement; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
Type :
conf
DOI :
10.1109/ICSICT.1998.786062
Filename :
786062
Link To Document :
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