Title :
Improved Bridgman technique for the growth of AgGaSe2 single crystals
Author :
Guangzhong, Xie ; Yadong, Jianng ; Zhiming, Wu ; Shifu, Zhu
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
AgGaSe2 crystal growth has been realized by an improved Bridgman technique with only a one-zone vertical growth furnace. The technique is to make the solid-liquid interface move from the bottom to the top of the AgGaSe2 melting polycrystalline materials to grow AgGaSe2 single crystals by controlling the growth temperature. Boules with size of Φ12×50 mm and Φ10×20 mm were grown out of the polycrystalline material with different growth rates of 0.2 mm/h and 0.8 mm/h respectively. Analysis of their X-ray diffraction and SEM micrographs shows that the boules were AgGaSe2 single crystals
Keywords :
X-ray diffraction; crystal growth from melt; gallium compounds; scanning electron microscopy; semiconductor growth; silver compounds; ternary semiconductors; AgGaSe2; SEM; X-ray diffraction; growth rate; growth temperature; improved Bridgman technique; one-zone vertical growth furnace; single crystals; Crystalline materials; Crystals; Furnaces; Optical devices; Optical scattering; Scanning electron microscopy; Temperature control; Temperature distribution; Temperature measurement; Temperature sensors;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.786063