DocumentCode
3069128
Title
Bio-Inspired Integrated Chips for Telecommunications S/W Defect-Tracking
Author
Abdel-Aty-Zohdy, Hoda S. ; Sherif, Mostafa Hashem ; Smiarowski, Adam, Jr. ; Searing, Brian
Author_Institution
Oakland Univ., Rochester Hills
fYear
2007
fDate
15-18 Dec. 2007
Firstpage
778
Lastpage
784
Abstract
Defect tracking is important in evaluating the reliability of the software used in telecommunication networks. Bio-inspired integrated approaches and embedded chips have been developed and implemented to track improvements in the software reliability. In this paper, the integrated model for the failure discovery during testing is combined with bio-inspired approaches using the recurrent dynamic neural network (RDNN) with parametric adjustments and wavelets as basis; and the adaptive parameters RDNN (ARDNN) where the criterion is to minimize the error in failure intensity estimation, subject to the model constraints. Simulation results favor our adaptive recurrent dynamic neural network, with reduced error from 88% to 1.25 -to- 8% based on the number of iterations in the training phase.. The ARDNN approach provides optimum solution to the dynamic problem at hand since it iterates on the shape of the wavelet basis and provide adequate recovery of the data in the form of piecewise linear differential.
Keywords
learning (artificial intelligence); microprocessor chips; program debugging; program testing; recurrent neural nets; software reliability; telecommunication computing; telecommunication networks; wavelet transforms; adaptive parameter RDNN; bio-inspired integrated chips; embedded chips; failure discovery; recurrent dynamic neural network; software reliability; telecommunication networks; telecommunication software defect-tracking; wavelet-basis RDNN; Biomedical signal processing; Computer networks; Genetic algorithms; Information technology; Microelectronics; Neural networks; Parameter estimation; Recurrent neural networks; Software testing; Telecommunication network reliability; Bio-Inspired; Integrated Chips; Neural Networks; Telecommunication Defect Tracking;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing and Information Technology, 2007 IEEE International Symposium on
Conference_Location
Giza
Print_ISBN
978-1-4244-1835-0
Electronic_ISBN
978-1-4244-1835-0
Type
conf
DOI
10.1109/ISSPIT.2007.4458062
Filename
4458062
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