Title :
250 Mbyte/sec synchronous DRAM using a 3-stage-pipelined architecture
Author :
Takai, Y. ; Nagase, M. ; Kitamura, M. ; Koshikawa, Y. ; Yoshida, N. ; Kobayashi, Y. ; Obara, T. ; Fukuzo, Y. ; Watanabe, H.
Author_Institution :
LSI Memory Div., NEC Corp., Sagamihara, Japan
Abstract :
A 3.3 V 512 k/spl times/18/spl times/2 bank synchronous DRAM has been developed using a novel 3-stage-pipelined architecture. The address-access path which is usually designed by analog means, is digitized, separated into three stages by latch circuits at the column switch and data-out buffer. Since this architecture requires no additional read/write bus and data amp, it minimizes an increase in die size. Using the standardized GTL interface, a 250 Mbyte/sec synchronous DRAM with almost the same die-size as the conventional DRAM has been achieved.
Keywords :
CMOS integrated circuits; DRAM chips; pipeline processing; 0.5 micron; 18432 kbit; 250 Mbyte/s; 3-stage-pipelined architecture; 3.3 V; column switch; data-out buffer; dynamic RAM; latch circuits; standardized GTL interface; synchronous DRAM; three stage pipeline; CMOS integrated circuits, memory; DRAM chips; Pipeline processing;
Conference_Titel :
VLSI Circuits, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIC.1993.920536