• DocumentCode
    3069583
  • Title

    Bidirectional matched global bit line scheme for high density DRAMs

  • Author

    Ahn, J.H. ; Kim, T.H. ; Park, S.M. ; Wang, S.H. ; Hee-Gook Lee

  • Author_Institution
    Res. & Dev. Lab., GoldStar Electron Co. Ltd., Seoul, South Korea
  • fYear
    1993
  • fDate
    19-21 May 1993
  • Firstpage
    91
  • Lastpage
    92
  • Abstract
    A new bit line organization, called Bidirectional Matched Global Bit Line (BMGB) scheme, is designed to overcome the difficulties in layout implementation and the high susceptibility to noise of conventional open bit line structure. In this scheme, the local bit line pairs are placed close to each other and well-balanced folded bit line type global bit lines are used. Measured results from a test chip, processed with 0.35 /spl mu/m technology, shows that cell array size can be reduced about 15%, while a similar performance is obtained to that of a conventional folded bit line architecture. This scheme can also be used with folded type local bit lines.
  • Keywords
    DRAM chips; MOS integrated circuits; VLSI; 0.35 micron; bidirectional matched global bit line scheme; dynamic RAM; folded bit line type global bit lines; folded type local bit lines; high density DRAMs; DRAM chips; MOS integrated circuits, memory; Very-large-scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1993. Digest of Technical Papers. 1993 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Type

    conf

  • DOI
    10.1109/VLSIC.1993.920552
  • Filename
    920552