DocumentCode
3069583
Title
Bidirectional matched global bit line scheme for high density DRAMs
Author
Ahn, J.H. ; Kim, T.H. ; Park, S.M. ; Wang, S.H. ; Hee-Gook Lee
Author_Institution
Res. & Dev. Lab., GoldStar Electron Co. Ltd., Seoul, South Korea
fYear
1993
fDate
19-21 May 1993
Firstpage
91
Lastpage
92
Abstract
A new bit line organization, called Bidirectional Matched Global Bit Line (BMGB) scheme, is designed to overcome the difficulties in layout implementation and the high susceptibility to noise of conventional open bit line structure. In this scheme, the local bit line pairs are placed close to each other and well-balanced folded bit line type global bit lines are used. Measured results from a test chip, processed with 0.35 /spl mu/m technology, shows that cell array size can be reduced about 15%, while a similar performance is obtained to that of a conventional folded bit line architecture. This scheme can also be used with folded type local bit lines.
Keywords
DRAM chips; MOS integrated circuits; VLSI; 0.35 micron; bidirectional matched global bit line scheme; dynamic RAM; folded bit line type global bit lines; folded type local bit lines; high density DRAMs; DRAM chips; MOS integrated circuits, memory; Very-large-scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location
Kyoto, Japan
Type
conf
DOI
10.1109/VLSIC.1993.920552
Filename
920552
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