Title :
Look-ahead input buffer and dynamic load sensing scheme for 3.3 V ultrafast BiCMOS SRAMs
Author :
Jung, C.M. ; Park, H.C. ; Ahn, K.S. ; Lee, J.H. ; Kweon, K.H. ; Choi, J.Y. ; Ejaz Haq ; Lim, H.K.
Author_Institution :
Product Dev. Center, Samsung Electron. Co. Ltd., Seoul, South Korea
Abstract :
Achieving fast access time at low voltage and low power is still a demanding task for high density SRAM. Although some previous BiCMOS designs operate at 3.3 V, the access time is usually slower than at 5 V. The speed is mainly dependent on the I/O interface conversion and delay due to long data lines. We developed a look-ahead input buffer to reduce the speed delay at the input stage and a dynamic load sensing scheme to minimize the sensing delay due to long data line. A 3.3 V 1 Mbit(l28K x 8) SRAM is designed to achieve 4.5 ns access time under typical conditions using 0.5 /spl mu/m BiCMOS technology.
Keywords :
BiCMOS integrated circuits; SRAM chips; VLSI; buffer storage; 0.5 micron; 1 Mbit; 3.3 V; 4.4 ns; access time; dynamic load sensing scheme; high density SRAM; look-ahead input buffer; ultrafast BiCMOS SRAMs; BiCMOS integrated circuits, memory; Buffer memories; SRAM chips; Ultra-high-speed integrated circuits;
Conference_Titel :
VLSI Circuits, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIC.1993.920563