• DocumentCode
    3069873
  • Title

    Antiepileptic drug intervention decouples electroencephalogram (EEG) signals: A case study in Unverricht-Lundborg Disease

  • Author

    Liu, Chang-Chia ; Xanthopoulos, Petros ; Chaovalitwongse, W.Art ; Pardalos, Panos M. ; Uthman, Basim M.

  • Author_Institution
    J. Crayton Pruitt Family Department of Biomedical Engineering, University of Florida, Gainesville, 32611-6131 USA
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    2108
  • Lastpage
    2111
  • Abstract
    Change in severity of myoclonus as an outcome measure of antiepileptic drug (AED) treatment in patients with Unverricht-Lundborg Disease (ULD) has been estimated by utilizing the Unified Myoclonus Rating Scale (UMRS). In this study, we measure treatment effects through EEG analysis using mutual information approach to quantify interdenpence/coupling strength among different electrode sites. Mutual information is known to have the ability to capture linear and non-linear dependencies between EEG time series with superior performance over the traditional linear measures. One subject with ULD participated in this study and 1-hour EEG recordings were acquired before and after treatment of AED. Our results indicate that the mutual information is significantly lower after taking the add-on AED for four weeks at least. This finding could lead to a new insight for developing a new outcome measure for patient with ULD, when UMRS could potentially fail to detect a significant difference.
  • Keywords
    Art; Biomedical engineering; Biomedical measurements; Diseases; Drugs; Electroencephalography; Epilepsy; Medical treatment; Mutual information; Systems engineering and theory; Anticonvulsants; Electroencephalography; Female; Humans; Middle Aged; Models, Neurological; Myoclonus; Treatment Outcome; Unverricht-Lundborg Syndrome;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4649609
  • Filename
    4649609