DocumentCode :
3070275
Title :
Electron transport in fast dielectric liquids at high applied electric fields
Author :
Faidas, H. ; Christophorou, L.C. ; McCorkle, D.L.
Author_Institution :
Oak Ridge Nat. Lab., TN, USA
fYear :
1990
fDate :
10-14 Sep 1990
Firstpage :
34
Lastpage :
38
Abstract :
The drift velocity, w, of excess electrons as a function of the applied uniform electric field, E, in liquid 2,2-dimethylpropane (TMC), tetramethylsilane (TMS), tetramethylgermanium (TMG), tetramethyltin (TMT), and 2,2,4,4-tetramethylpentane (TMP), as well as in mixtures of TMS with TMP (mole ratio M=1.31/1) and n-pentane (M=102/1, 17/1, and 5.6/1), has been measured for E-values up to ~105 V-cm-1. The thermal electron mobility in the above liquids is 71.5, 119.3, 114.7, 85.7, 31.8, 39.1, 118, 85, and 47.6 cm2 s-1 V-1, respectively. Electrical breakdown in TMS, TMP, and the mixtures occurred at E>165 V-cm-1. In TMT it occurred at rather low fields (E≠7.5×104 V-cm-1), and it led to significant decomposition of the liquid and deposition of tin on the cell walls and the electrodes. In TMC and TMG no breakdown occurred up to the highest field reached
Keywords :
carrier mobility; dielectric properties of liquids and solutions; dissociation; electric breakdown of liquids; electrical conductivity of liquids; high field effects; organic compounds; organometallic compounds; 2,2,4,4-tetramethylpentane; 2,2-dimethylpropane; decomposition; electrical breakdown; excess electron drift velocity; fast dielectric liquids; high applied electric fields; mixtures; n-pentane; tetramethylgermanium; tetramethylsilane; tetramethyltin; thermal electron mobility; Anodes; Cathodes; Contracts; Dielectric liquids; Electron mobility; Health and safety; Ionization; Optical pulses; Physics; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Dielectric Liquids, 1990. ICDL 1990. Conference Record., 10th International Conference on
Conference_Location :
Grenoble
Type :
conf
DOI :
10.1109/ICDL.1990.202854
Filename :
202854
Link To Document :
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