Title : 
Concurrent sample path analysis of discrete event systems
         
        
            Author : 
Cassandras, Christos G. ; Panayiotou, Christos G.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
         
        
        
        
        
        
            Abstract : 
The sample path constructability problem for discrete event systems (DES) involves the observation of a sample path under a particular parameter value θ of the system with the requirement to concurrently construct multiple sample paths of the DES under different values using only information available along the given sample path. This allows the on-line estimation of performance measures of the form J(θ), not available in closed form, over a range of values of θ. We present a sample path coupling approach that solves the problem without imposing any restrictions on the event processes in the system. A specific “time warping” algorithm is described and its performance is analysed in terms of computational cost. We also identify a structural condition on DES, termed regularity: in regular DES the occurrence of any event can never trigger more than one additional event at the next state. We have found that for DES with this property (satisfied by a wide range of systems) concurrent sample path construction techniques are computationally efficient
         
        
            Keywords : 
discrete event systems; queueing theory; stochastic automata; concurrent sample path analysis; discrete event systems; online estimation; performance measures; regularity; sample path constructability; sample path coupling approach; structural condition; time warping algorithm; Algorithm design and analysis; Analytical models; Computational efficiency; Concurrent computing; Contracts; Control systems; Design optimization; Discrete event systems; Performance analysis; Stochastic processes;
         
        
        
        
            Conference_Titel : 
Decision and Control, 1996., Proceedings of the 35th IEEE Conference on
         
        
            Conference_Location : 
Kobe
         
        
        
            Print_ISBN : 
0-7803-3590-2
         
        
        
            DOI : 
10.1109/CDC.1996.573665