Title :
Application and operation of a superconducting sampler based instrumentation system
Author :
Hanson, Eric ; Shen, Zhi-Yuan
Author_Institution :
Hypres Inc., Elmsford, NY, USA
Abstract :
A superconducting sampler system with a self-triggering mechanism achieved a 70-GHz bandwidth, 5-ps rise time resolution, 20-μV r.m.s. (root mean square) noise floor, less than 1-ps jitter, and an 8-mV, 70-GHz triggering capability. The sampler was used for studying ion-induced SEU (single-event-upset) transient phenomena in silicon diodes and GaAs MESFETs. Compared with conventional methods, the superconducting sampling system is easy to use and provides superior capabilities. An SEU transient has been measured with a record 25-ps rise time. The superconducting sampler configured as a TDR (time-domain reflectometer) has achieved a 2.5-ps rise time at the I/O interface after deconvolution. This corresponds to a 0.375-mm spatial resolution. It is concluded that the TDR can provide useful information for improving the performance of microwave and millimeter-wave devices
Keywords :
III-V semiconductors; Schottky gate field effect transistors; elemental semiconductors; gallium arsenide; integrated circuit testing; ion beam effects; semiconductor device testing; semiconductor diodes; silicon; superconducting junction devices; transients; 2.5 ps; 70 GHz; GaAs; I/O interface; Josephson effect; MESFET; Si diodes; deconvolution; instrumentation; ion induced transient; microwave devices; millimeter-wave devices; self-triggering; single event upset transient; superconducting sampler; time-domain reflectometer; Bandwidth; Diodes; Gallium arsenide; Jitter; MESFETs; Root mean square; Sampling methods; Silicon; Superconducting device noise; Superconducting microwave devices;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/IMTC.1990.66012
