Author_Institution :
Sch. of Transp. Eng., Tongji Univ., Shanghai, China
Abstract :
Notice of Violation of IEEE Publication Principles
"An Improved Modular Approach for System Reliability Analysis,"
by Yongjian Tao, Decun Dong,
in the Proceedings of the 2009 WASE International Conference on Information Engineering, November 2009, pp. 111-113
After careful and considered review of the content and authorship of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE\´s Publication Principles.
This paper contains portions of text from the paper(s) cited below. A credit notice is used, but due to the absence of quotation marks or offset text, copied material is not clearly referenced or specifically identified.
"A Discrete-time Bayesian Network Reliability Modeling and Analysis Framework"
by H. Boudali, J. B. Dugan.
in Reliability Engineering and System Safety, vol. 87(3):, March 2005, pp. 337-349
A modular method, based on Binary Decision Diagrams and Bayesian Networks, is proposed to analyze system reliability. A fault tree is divided into independent subtrees using a very efficient linear time algorithm. Different solution techniques are applied to each subtree depending on the latter\´s characteristics, Binary Decision Diagrams solution for static fault trees, and Bayesian Networks solution for dynamic fault trees. The solutions of various independent subtrees are integrated to obtain the reliability of urban mass transit vehicles. The modular method, based on based on Binary Decision Diagrams and Bayesian Networks, can overcome main shortcomings of Markov Chains, and is useful for assessing the reliability of large and complex systems.
Keywords :
Markov processes; belief networks; binary decision diagrams; fault trees; reliability theory; transportation; Bayesian network; Markov chain; binary decision diagram; efficient linear time algorithm; fault tree; modular approach; system reliability analysis; urban mass transit vehicle; Bayesian methods; Binary decision diagrams; Boolean functions; Data structures; Explosions; Fault trees; Information analysis; Reliability engineering; State-space methods; Vehicle dynamics; Bayesian Networks; Binary Decision Diagram; system reliability;