DocumentCode :
3071458
Title :
Comparison of Two Gabor Texture Descriptor for Texture Classi?cation
Author :
Zhan, Xu ; Xingbo Sun ; Yuerong, Lei
Author_Institution :
Dept. of Electron. Eng., Sichuan Univ. of Sci. & Eng., Zigong, China
Volume :
1
fYear :
2009
fDate :
10-11 July 2009
Firstpage :
52
Lastpage :
56
Abstract :
Gabor texture descriptor have gained much attention for different aspects of computer vision and pattern recognition. Recently, on the Rayleigh nature of Gabor filter out-puts Rayleigh model Gabor texture descriptor is proposed.In this paper, we investigate the performance of these two Gabor texture descriptor in texture classification. We built a texture classification system based on BPNN, and use the corresponding feature vector from traditional Gabor texture descriptor or Rayleigh model one as input of BPNN. We use three datasets from the Brodatz album database. For all the three datasets, the original texture images are subdivided into non-overlapping samples of size 32 times 32. 50%of the total samples are used for training and the rest are used for testing. We compare the system training time and recognition accuracy between two Gabor texture descriptor.The experimental results show that, it takes more time when using Rayleigh model Gabor texture descriptor than traditional one, and the traditional Gabor texture descriptor is more accuracy. Rayleigh model Gabor texture descriptor modifies texture descriptor with nearly half the dimensionality and less computational expense, but it lose some performance compared with traditional one.
Keywords :
Gabor filters; backpropagation; computer vision; image texture; neural nets; pattern classification; vectors; BPNN; Brodatz album database; Gabor filter; Gabor texture descriptor; Rayleigh model; Rayleigh nature; computer vision; feature vector; pattern recognition; texture classification; texture images; Computer vision; Face recognition; Fingerprint recognition; Frequency estimation; Gabor filters; Image databases; Image segmentation; Neural networks; Pattern recognition; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Engineering, 2009. ICIE '09. WASE International Conference on
Conference_Location :
Taiyuan, Shanxi
Print_ISBN :
978-0-7695-3679-8
Type :
conf
DOI :
10.1109/ICIE.2009.20
Filename :
5211148
Link To Document :
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