• DocumentCode
    3071468
  • Title

    Nature of late breakdowns in VI´s after short circuit interruption

  • Author

    Schellekens, Hans ; Olive, S. ; Kien Phan Huy ; Ndiaye, Priscilla ; Pasqualini, C.

  • Author_Institution
    Schneider Electric, Protection Power Control, Technical Division Usine 38V, 38050 Crenoble cedex 9, France
  • Volume
    2
  • fYear
    2004
  • fDate
    Sept. 27 2004-Oct. 1 2004
  • Firstpage
    454
  • Lastpage
    458
  • Abstract
    Late breakdowns in vacuum interrupters after short circuit current interruption are studied with three methods. 1. High speed photography of the contact surface and the inter-electrode space to correlate the position of the restrike with respect to the prevailing conditions on the contact surface : 2. Spectrography during arcing and restrike to evaluate ionized particle densities and electron density ; and 3. A double imaging system to calculate the trajectories of droplets during the TRV phase. We found 95% of the restrikes to be associated with hydrogen in the inter-electrode gap at current zero, and remaining hot spots on the edge of the contact surface. We conclude the breakdown to be of a mixed Paschen type: partially in metal vapour of high density around hot spots and ignited by thermal electron emission, and partially in hydrogen gas which accumulates during arcing in the interrupter.
  • Keywords
    Cameras; Cathodes; Circuit testing; Contacts; Dielectric breakdown; Electric breakdown; Hydrogen; Interrupters; Surface discharges; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. XXIst International Symposium on
  • Conference_Location
    Yalta, Crimea
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-8461-X
  • Type

    conf

  • DOI
    10.1109/DEIV.2004.1422645
  • Filename
    1422645