DocumentCode
3071468
Title
Nature of late breakdowns in VI´s after short circuit interruption
Author
Schellekens, Hans ; Olive, S. ; Kien Phan Huy ; Ndiaye, Priscilla ; Pasqualini, C.
Author_Institution
Schneider Electric, Protection Power Control, Technical Division Usine 38V, 38050 Crenoble cedex 9, France
Volume
2
fYear
2004
fDate
Sept. 27 2004-Oct. 1 2004
Firstpage
454
Lastpage
458
Abstract
Late breakdowns in vacuum interrupters after short circuit current interruption are studied with three methods. 1. High speed photography of the contact surface and the inter-electrode space to correlate the position of the restrike with respect to the prevailing conditions on the contact surface : 2. Spectrography during arcing and restrike to evaluate ionized particle densities and electron density ; and 3. A double imaging system to calculate the trajectories of droplets during the TRV phase. We found 95% of the restrikes to be associated with hydrogen in the inter-electrode gap at current zero, and remaining hot spots on the edge of the contact surface. We conclude the breakdown to be of a mixed Paschen type: partially in metal vapour of high density around hot spots and ignited by thermal electron emission, and partially in hydrogen gas which accumulates during arcing in the interrupter.
Keywords
Cameras; Cathodes; Circuit testing; Contacts; Dielectric breakdown; Electric breakdown; Hydrogen; Interrupters; Surface discharges; Vacuum breakdown;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. XXIst International Symposium on
Conference_Location
Yalta, Crimea
ISSN
1093-2941
Print_ISBN
0-7803-8461-X
Type
conf
DOI
10.1109/DEIV.2004.1422645
Filename
1422645
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