Title :
Nature of late breakdowns in VI´s after short circuit interruption
Author :
Schellekens, Hans ; Olive, S. ; Kien Phan Huy ; Ndiaye, Priscilla ; Pasqualini, C.
Author_Institution :
Schneider Electric, Protection Power Control, Technical Division Usine 38V, 38050 Crenoble cedex 9, France
fDate :
Sept. 27 2004-Oct. 1 2004
Abstract :
Late breakdowns in vacuum interrupters after short circuit current interruption are studied with three methods. 1. High speed photography of the contact surface and the inter-electrode space to correlate the position of the restrike with respect to the prevailing conditions on the contact surface : 2. Spectrography during arcing and restrike to evaluate ionized particle densities and electron density ; and 3. A double imaging system to calculate the trajectories of droplets during the TRV phase. We found 95% of the restrikes to be associated with hydrogen in the inter-electrode gap at current zero, and remaining hot spots on the edge of the contact surface. We conclude the breakdown to be of a mixed Paschen type: partially in metal vapour of high density around hot spots and ignited by thermal electron emission, and partially in hydrogen gas which accumulates during arcing in the interrupter.
Keywords :
Cameras; Cathodes; Circuit testing; Contacts; Dielectric breakdown; Electric breakdown; Hydrogen; Interrupters; Surface discharges; Vacuum breakdown;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. XXIst International Symposium on
Conference_Location :
Yalta, Crimea
Print_ISBN :
0-7803-8461-X
DOI :
10.1109/DEIV.2004.1422645