Title :
Tomographic microscopy using a plenoptic sensor
Author :
Trujillo-Sevilla, J. ; Rodriguez-Ramos, Jose M. ; Rodriguez-Ramos, L.F. ; Javidi, Bahram
Author_Institution :
Univ. of La Laguna, La Laguna, Spain
Abstract :
Plenoptic sensors have been developed as passive method for 3D scanning of a scene by the intensity of the light. In this work a new method to measure 3D, not by its intensity but its wavefront phase, is presented. Microscopy on translucent or fluorescent samples, can take advantage of this technique. Preliminary studies and simulations are presented to show the feasibility of the technique.
Keywords :
fluorescence; image sensors; optical microscopy; optical tomography; optical variables measurement; wavefront sensors; 3D scanning; fluorescent sample; light intensity; passive method; plenoptic sensor; tomographic microscopy; translucent sample; wavefront phase; Extraterrestrial measurements; Image reconstruction; Lenses; Microscopy; Phase measurement; Three-dimensional displays; Tomography; microscopy; plenoptic; tomography; wavefront;
Conference_Titel :
Information Optics (WIO), 2013 12th Workshop on
Conference_Location :
Puerto de la Cruz
DOI :
10.1109/WIO.2013.6601246
