DocumentCode :
3071522
Title :
Image processing for super-resolution localization in fluorescence microscopy
Author :
Ilovitsh, Tali ; Meiri, Amihai ; Zalevsky, Zeev ; Ebeling, Carl ; Menon, Rajesh ; Gerton, Jordan M. ; Jorgensen, Erik M.
Author_Institution :
Fac. of Eng., Bar-Ilan Univ., Ramat-Gan, Israel
fYear :
2013
fDate :
15-19 July 2013
Firstpage :
1
Lastpage :
4
Abstract :
Localization of a single fluorescent particle with sub-diffraction limit accuracy is a key merit in fluorescence microscopy. Implementation of nonlinear filtering algorithms prior the localization process can improve the localization accuracy of standard existing methods and also enable the localization of overlapping particles, allowing the use of increased fluorophore activation density, and thereby increased data collection speed. In this paper we present the use of an image decomposition algorithm termed K-factor which reduces an image into a nonlinear set of contrast-ordered decompositions whose joint product reassembles the original image. The K-factor technique is implemented on the images, prior to the localization of the fluorescent probes. Numerical simulations of fluorescence data with random probe positions, and especially at high densities of activated fluorophores demonstrated an improvement in the localization precision with compare to single fitting techniques. Implanting the proposed concept also on experimental data of cellular structures yielded the theoretically predicted resolution enhancement.
Keywords :
biological techniques; biology computing; cellular biophysics; fluorescence; image processing; nonlinear filters; numerical analysis; optical filters; optical microscopy; optical resolving power; organic compounds; K-factor technique; cellular structure experimental data; contrast-ordered decomposition; data collection speed; fluorescence data; fluorescence microscopy; fluorescent probe localization; fluorophore activation density; high activated fluorophore density; image decomposition algorithm; image processing; image reduction; joint product reassembly; localization accuracy; localization precision improvement; localization process; nonlinear filtering algorithm; numerical simulation; overlapping particle localization; random probe position; single fitting technique; single fluorescent particle localization; subdiffraction limit accuracy; super-resolution localization; theoretically predicted resolution enhancement; Fitting; Fluorescence; Image reconstruction; Image resolution; Microscopy; Noise; Optical microscopy; Fluorescence microscopy; Image processing; Image reconstruction techniques; Superresolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Optics (WIO), 2013 12th Workshop on
Conference_Location :
Puerto de la Cruz
Type :
conf
DOI :
10.1109/WIO.2013.6601248
Filename :
6601248
Link To Document :
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