Adaptive De-noising Filter Algorithm for CMOS Image Sensor Testing Applications

Author

Hsu, Chun-Lung ; Lan, Chen-Wei ; Lo, Yu-Chih ; Huang, Yu-Sheng

Author_Institution

Dept. of Electr. Eng., Nat. Dong Hwa Univ., Hualien, Taiwan

fYear

2010

fDate

6-8 Oct. 2010

Firstpage

136

Lastpage

143

Abstract

This paper proposes an adaptive de-nosing filter (ADF) algorithm to effectively remove the image defects for the CMOS image sensor testing applications. Based on the median filter technique, the proposed ADF algorithm develops a pre-processing method to generate adaptive detection windows for pixel defect de-noising of an image. Experimental results and comparisons show that the proposed ADF algorithm can provide a significant ability of defects de-noising for supporting good performance in peak signal-to-noise ratio (PSNR) and image quality.

Keywords

CMOS image sensors; adaptive filters; image denoising; median filters; CMOS image sensor testing; adaptive de-noising filter algorithm; adaptive detection windows; image quality; median filter technique; peak signal-to-noise ratio; pixel defect de-noising; Algorithm design and analysis; CMOS image sensors; Filtering algorithms; Image quality; Noise; Noise reduction; Pixel; CMOS image sensor; PSNR; adaptive de-nosing filter algorithm; image quality;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on

Conference_Location

Kyoto

ISSN

1550-5774

Print_ISBN

978-1-4244-8447-8

Type

conf

DOI

10.1109/DFT.2010.23

Filename

5634879