DocumentCode :
3072650
Title :
The Micromagnetics Of Defects In Film Stacks With Interlayer Exchange Coupling
Author :
van den Berg, H.A.M. ; Schmeusser, S.
Author_Institution :
Siemens AG, Erlangen, Bavaria, P.O. Box 3220, Fed. Rep. Germany
fYear :
1993
fDate :
13-16 April 1993
Keywords :
Anisotropic magnetoresistance; Boundary conditions; Couplings; Magnetic anisotropy; Magnetic confinement; Magnetic domain walls; Magnetic hysteresis; Micromagnetics; Perpendicular magnetic anisotropy; Saturation magnetization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
Type :
conf
DOI :
10.1109/INTMAG.1993.642020
Filename :
642020
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3072650
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