DocumentCode
3072703
Title
Study on manufacturing process of semi-flex Printed Circuit Board using buried material
Author
Xuemei He ; Wei He ; Xinhong Su ; Yongshuan Hu ; Yong Huang ; Minjie Ning ; Lijuan Cheng
Author_Institution
Sch. of Microelectron. & Solid-State Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2012
fDate
24-26 Oct. 2012
Firstpage
329
Lastpage
332
Abstract
In this paper, the semi-flex Printed Circuit Board (PCB) was manufactured by using buried material to prevent resin of high-flow prepreg from flowing into the flexible area in lamination process. Windows in which the buried materials were imbedded were shaped in advance in prepreg and cores. The circuit in flexible area was protected by polyimide (PI) cove layer. The preventing capability of resin for the three different buried materials including epoxy resin base material, silicon sheet and Teflon (PTFE) were studied by microsection manufacture and Optical Critical Dimension, and the results showed that the silicon sheet was the most appropriate one. Manufacturing processes such as the heating rate in lamination process, sizes of silicon sheet and windows of prepreg were studied by the orthogonal tests and the optimal manufacturing parameters were analyzed and achieved by Minitab Software. Several demonstration tests were conducted under optimal manufacturing condition and the results including resin length and flexural ability were acceptable. The reliability of semi-flex PCB was evaluated by solder float test, thermal shock test and salt spray test. The results showed that the flexible area had substantially no defects such as bubbles, separation and flaws occurred and delamination had not occurred in the rigid-flex joint of the products, and the resistance value change was 5.37% in thermal shock test. The reliability of semi-flex PCB was acceptable.
Keywords
flexible electronics; printed circuit manufacture; printed circuit testing; soldering; thermal shock; PTFE; Teflon; buried material; lamination process; manufacturing process; optical critical dimension; polyimide cove layer; salt spray test; semiflex printed circuit board; silicon sheet; solder float test; thermal shock test; Joints; Lamination; Manufacturing; Reliability; Resins; Silicon; Buried Material; Orthogonal Tests; Semi-flex Printed Circuit Board; Silicon Sheet;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4673-1635-4
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2012.6420215
Filename
6420215
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