DocumentCode
3072710
Title
A Switch Box Architecture to Mitigate Bridging and Short Faults in SRAM-Based FPGAs
Author
Ebrahimi, Hassan ; Zamani, Morteza Saheb ; Razavi, Seyyed Ahmad
Author_Institution
Dept. of Comput. Eng., Amirkabir Univ. of Technol., Tehran, Iran
fYear
2010
fDate
6-8 Oct. 2010
Firstpage
218
Lastpage
224
Abstract
SRAM-based FPGAs suffer from soft errors caused by cosmic particles. This paper introduces a new switch box architecture to mitigate soft errors. In this switch box architecture, the number of SRAM bits required for programming the switch boxes is reduced by means of switch reduction with slight impact on routing capability of the switch box. This architecture does not require any modification of the existing placement and routing algorithms. The proposed architecture was evaluated on several MCNC benchmarks using VPR tool. The experimental results show that this architecture decreases the susceptibility of switch boxes to single event upsets by about 18% on average compared to the traditional ones. Also, our architecture decreases the probability of ridging and short faults in the switch boxes by about 32% on average.
Keywords
SRAM chips; field programmable gate arrays; switches; MCNC benchmarks; SRAM bits; SRAM-based FPGA; VPR tool; bridging faults; routing capability; short faults; single event upsets; soft errors; switch box architecture; switch reduction; Circuit faults; Computer architecture; Field programmable gate arrays; Random access memory; Routing; Switches; Wire; Bridging and Short Faults; Fault Mitigation; SRAM-Based FPGAs; Switch Box;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location
Kyoto
ISSN
1550-5774
Print_ISBN
978-1-4244-8447-8
Type
conf
DOI
10.1109/DFT.2010.33
Filename
5634899
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