• DocumentCode
    3072937
  • Title

    Tensile test of small lead-free solder joint using permanent magnet

  • Author

    Tada, N. ; Nishihara, R. ; Masago, Hiroyasu

  • Author_Institution
    Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama, Japan
  • fYear
    2012
  • fDate
    24-26 Oct. 2012
  • Firstpage
    145
  • Lastpage
    148
  • Abstract
    Since solder materials are often used for electric connections in various electric devices, the strength of solders and that of interfaces to the other metallic materials are very important. After the restriction of lead solder usage according to the European Union Waste Electrical and Electronic Equipment (WEEE) and Restriction of Hazardous Substances (RoHS) Directives, various lead-free solders have been developed and their optimized joining condition is being investigated. The mechanical test of solder joints is one of the best ways to check the joining condition and it gives us useful information to secure the safety of electric devices. From the viewpoint of mechanical testing, it is not easy to handle the solder materials because of their very low deformation resistance and small size. In this paper, a new method of tensile test is proposed using permanent magnet, and the results are discussed. By using the permanent magnet, various non-contact tensile tests are going to be possible. The present paper is a basic study to realize the non-contact tensile tests for micro materials.
  • Keywords
    RoHS compliance; WEEE Directive; permanent magnets; solders; tensile testing; European Union Waste Electrical and Electronic Equipment; Restriction of Hazardous Substances; RoHS directive; WEEE directive; deformation resistance; electric connections; joining condition; mechanical testing; noncontact tensile tests; permanent magnet; solder joint; solder materials; Fixtures; Magnetic forces; Magnetic resonance imaging; Materials; Permanent magnets; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4673-1635-4
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2012.6420226
  • Filename
    6420226