DocumentCode :
3073084
Title :
Industrial Approach for Dependability
Author :
Kanekawa, Nobuyasu
Author_Institution :
Hitachi Res. Lab., Hitachi Ltd., Hitachi, Japan
fYear :
2010
fDate :
6-8 Oct. 2010
Firstpage :
299
Lastpage :
299
Abstract :
This presentation introduces author´s and (his affiliation´s) industrial approach for dependability. The author´s affiliation has long history of dependable system technology starting with railway and nuclear power generation fields. The author proposed self-checking techniques and optimal time diversity method to maximize fault detection and recovery coverage to realize ultimate high-reliability at the middle of 1990´s. The technology established thus was applied to the railway control system such as electronic railroad crossing controllers starting with LSI (Large -Scale Integration Circuit) for ATP (Automatic Train Protection). The authors applied the ultimate high-reliable technologies to on-chip redundancy, which has redundant cores within one chip in 2000´s when multi-core processors which have plural processor cores within one chip appear as a result of development of high-density integration by the Moore´s Law. At the end of the presentation the author introduces X-by-Wire technology which challenges to control automotives with computer assistance as the latest application and the most prospective application of dependable LSI technology.
Keywords :
fault diagnosis; microprocessor chips; railway engineering; LSI technology; Moore´s law; X-by-wire technology; automatic train protection; automotive control; computer assistance; dependable system technology; electronic railroad crossing controller; fault detection; fault recovery coverage; industrial approach; large-scale integration circuit; multicore processor; nuclear power generation; optimal time diversity method; railway control system; self-checking technique; Diversity methods; Electrical fault detection; Fault detection; History; Large scale integration; Multicore processing; Rail transportation; LSI; Moore´s Law; X-by-Wire; fault detection coverage; optimal time diversity; recovery coverage; self-checking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location :
Kyoto
ISSN :
1550-5774
Print_ISBN :
978-1-4244-8447-8
Type :
conf
DOI :
10.1109/DFT.2010.43
Filename :
5634919
Link To Document :
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