Title :
Test Selection Policies for Faster Incremental Fault Detection
Author :
Amati, L. ; Bolchini, C. ; Salice, F.
Author_Institution :
Dip. Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
Incremental Automatic Functional Fault Detective is an incremental methodology based on a Bayesian Belief Network for the identification of the faulty component in a complex system, using data collected from a test session. Incremental Automatic Functional Fault Detective reduces time, cost and efforts during the diagnostic phase by implementing a step-by-step selection of the tests to be executed from the set of available tests. This paper focuses on the evolution of the Bayesian Belief Network nodes probabilities, presenting some selection heuristics to reduce the number of required tests. Validation is performed on a set of experimental results.
Keywords :
belief networks; fault tolerant computing; program verification; Bayesian belief network; faulty component; incremental automatic functional fault detection; test execution; Bayesian methods; Complexity theory; Computational modeling; FCC; Fault detection; Measurement; Probabilistic logic; Bayesian Network; Diagnosis Accuracy; Fault Detection;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-8447-8
DOI :
10.1109/DFT.2010.45