• DocumentCode
    3073309
  • Title

    Effective and efficient layer assignment for minimizing the temperature rise of large three-dimensional circuits

  • Author

    Hua-Hsin Yeh ; Shih-Hsu Huang

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2012
  • fDate
    24-26 Oct. 2012
  • Firstpage
    39
  • Lastpage
    42
  • Abstract
    Three-dimensional integrated circuit (3D IC) technology can improve the circuit performance and reduce the power dissipation. However, the heat generated by the stacked layers may cause a large amount of temperature rise. It is known that the layer assignment result has a great impact on the amount of temperature rise. Although the integer linear programming (ILP) approach can guarantee finding the minimum-temperature-rise layer assignment solution, solving the ILP formulation is an NP-hard problem. In this paper, we propose a heuristic algorithm to derive a near-optimal layer assignment solution in polynomial time complexity. Experimental results consistently show that our approach is very effective and efficient.
  • Keywords
    computational complexity; integer programming; linear programming; three-dimensional integrated circuits; 3D IC technology; ILP approach; NP-hard problem; heuristic algorithm; integer linear programming approach; layer assignment; minimum-temperature-rise layer assignment solution; near-optimal layer assignment solution; polynomial time complexity; power dissipation reduction; stacked layers; three-dimensional integrated circuit technology; Adders; Density measurement; Heuristic algorithms; Integrated circuits; Power dissipation; Power system measurements; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4673-1635-4
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2012.6420247
  • Filename
    6420247