Title :
A Hybrid Scheme for Concurrent Error Detection of Multiplication over Finite Fields
Author :
Ansari, Bijan ; Verbauwhede, Ingrid
Author_Institution :
Electr. Eng. Dept., Univ. of California, Los Angeles, CA, USA
Abstract :
Concurrent error detection (CED) schemes for finite field multipliers over GF(2m), based on simple parity bits, have been proposed in the literature. In this paper, we generalize the concept of parity and derive a hybrid scheme for CED. We extend the one-bit parity concept to multiple parity based on generalized (mod g(x)) reduction. Then, we combine this concept together with N-fold redundant reduction modules and apply this to finite field multipliers. The proposed scheme is faster and smaller than simple-parity-bit schemes and provides the same or better error detection capability. For example, implemented on FPGA for 20 parity bits over GF(2163), the overhead and output delay of the hybrid scheme are 7% and 39 nS, while those of the parity protected scheme are 80% and 198 nS, respectively.
Keywords :
error detection; parity check codes; FPGA; N-fold redundant reduction modules; concurrent error detection; error detection capability; finite field multipliers; finite fields; hybrid scheme; one-bit parity concept; parity bits; simple-parity-bit schemes; Circuit faults; Computer architecture; Delay; Integrated circuit modeling; Logic gates; Mathematical model; Polynomials; Concurrent Error Detection; Finite Fields; Multiplication;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-8447-8
DOI :
10.1109/DFT.2010.54