• DocumentCode
    3073468
  • Title

    Modeling interconnect behavior with a calibrated FEM model

  • Author

    Strong, Alvin ; Chen, Fen

  • Author_Institution
    IBM Corp., Essex Junction, VT, USA
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    59
  • Lastpage
    63
  • Abstract
    As dimensions continue to shrink and device densities increase, power and heat dissipation become an ever-increasing challenge. In this work, we investigate heat flow ramifications for a variety of very simple patterns. We start by describing the use of a finite element method (FEM) tool. This includes a brief description of the modeling procedure. The model results, for a given set of boundary conditions, are then compared to the physical measurements for that structure. Excellent agreement is demonstrated, thus calibrating the model. We then extend this model to structures for which we have no physical measurements. As importantly, we extend this model to structures and patterns that may be desirable for the next generation.
  • Keywords
    finite element analysis; heat transfer; integrated circuit interconnections; integrated circuit modelling; FEM tool; calibrated FEM model; finite element method; heat dissipation; heat flow; heat transfer; interconnect behavior modeling; power dissipation; Boundary conditions; Buildings; Extraterrestrial measurements; Finite element methods; Rivers; Shape; Silicon compounds; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2004 IEEE International
  • Print_ISBN
    0-7803-8517-9
  • Type

    conf

  • DOI
    10.1109/IRWS.2004.1422740
  • Filename
    1422740