Title :
Bluff-Probe Based Black Hole Node Detection and prevention
Author :
Sharma, Sanjeev ; Rajshree ; Pandey, Ravi Prakash ; Shukla, Vivek
Author_Institution :
Rajiv Gandhi Prodyogiki Vishwavidyalaya, SOIT, Bhopal
Abstract :
Security in wireless ad hoc network (WAN) is very important issue. Due to dynamic topology and mobility of nodes, Wireless Ad hoc Networks are more vulnerable to security attacks than conventional wired and wireless networks. Nodes of Wireless Ad hoc Network communicate directly without any central base station. That means in ad hoc network, infrastructure is not required for establishing communication. To provide security in small networks is easy as compare to large networks. For our convenience, we divide large network into number of zones. Therefore attacks in WAN are very frequent than other networks. In this research paper we are describing black hole attack which is easy to launch in wireless ad hoc network. Black hole attack is referred to as a node, dropping all packets and sending bogus information that it has shortest path between source and destination. In this paper we are implementing Secure-ZRP protocol which can be used to prevent black hole attack in zones or outside the zones. We evaluated performance in Qualnet simulator. Our analysis indicates that S-ZRP is very suitable to stop this attack.
Keywords :
ad hoc networks; mobility management (mobile radio); radio networks; telecommunication network topology; telecommunication security; Qualnet simulator; bluff-probe based black hole node detection; bluff-probe based black hole node prevention; dynamic topology; mobility of nodes; security; wireless ad hoc network; Ad hoc networks; Base stations; Communication system security; Mobile ad hoc networks; Network topology; Routing protocols; Wide area networks; Wireless application protocol; Wireless networks; Wireless sensor networks; Secure routing in WSN; Secure-ZRP protocol; WSN; Wireless Ad hoc Network; ZRP;
Conference_Titel :
Advance Computing Conference, 2009. IACC 2009. IEEE International
Conference_Location :
Patiala
Print_ISBN :
978-1-4244-2927-1
Electronic_ISBN :
978-1-4244-2928-8
DOI :
10.1109/IADCC.2009.4809054