DocumentCode :
3073496
Title :
Thermal simulation on typical high power diode packaging
Author :
Zhong-Yi Wu ; Pei-Hsuan Wu ; Chiou, Tim ; Chen, Ru Shan ; Lee, Razak ; Ben-Je Lwo
Author_Institution :
Dept. of Mechatron., Nat. Defense Univ., Taoyuan, Taiwan
fYear :
2012
fDate :
24-26 Oct. 2012
Firstpage :
343
Lastpage :
346
Abstract :
With the assistances from iteration methodology for heat dissipation property analyses and the effective material properties for the relatively complex PCB structures, this paper extracts the thermal resistance and the transient thermo-mechanical behaviors during reflow for two compactable high power diode packaging through the ANSYS software. After the simulations, further improvements on packaging structure designs were discussed according to the temperature and stress results.
Keywords :
cooling; printed circuit design; semiconductor device packaging; semiconductor diodes; thermal resistance; ANSYS software; heat dissipation property analyses; high power diode packaging; iteration methodology; material properties; relatively complex PCB structures; thermal resistance; thermal simulation; transient thermo-mechanical behaviors; Finite element methods; Materials; Packaging; Stress; Thermal analysis; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4673-1635-4
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2012.6420256
Filename :
6420256
Link To Document :
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