• DocumentCode
    3073506
  • Title

    Wavelet entropy characterization of elevated intracranial pressure

  • Author

    Xu, Peng ; Scalzo, Fabien ; Bergsneider, Marvin ; Vespa, Paul ; Chad, Miller ; Hu, Xiao

  • Author_Institution
    Neural Systems and Dynamics Laboratory, Department of Neurosurgery, the David Geffen School of Medicine, University of California, Los Angeles, USA
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    2924
  • Lastpage
    2927
  • Abstract
    Intracranial Hypertension (ICH) often occurs for those patients with traumatic brain injury (TBI), stroke, tumor, etc. Pathology of ICH is still controversial. In this work, we used wavelet entropy and relative wavelet entropy to study the difference existed between normal and hypertension states of ICP for the first time. The wavelet entropy revealed the similar findings as the approximation entropy that entropy during ICH state is smaller than that in normal state. Moreover, with wavelet entropy, we can see that ICH state has the more focused energy in the low wavelet frequency band (0–3.1 Hz) than the normal state. The relative wavelet entropy shows that the energy distribution in the wavelet bands between these two states is actually different. Based on these results, we suggest that ICH may be formed by the re-allocation of oscillation energy within brain.
  • Keywords
    Brain injuries; Cranial pressure; Electroencephalography; Entropy; Frequency; Hypertension; Neoplasms; Neurosurgery; Pathology; Patient monitoring; Algorithms; Brain; Cortical Synchronization; Electroencephalography; Entropy; Evoked Potentials; Humans; Intracranial Hypertension; Intracranial Pressure; Models, Neurological; Models, Statistical; Pressure; Probability; Signal Processing, Computer-Assisted; Time Factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4649815
  • Filename
    4649815