Title :
In-flight analysis of enabling technology
Author :
Moran, Amy K. ; LaBel, Kenneth A. ; Seidleck, Christina M. ; Barth, Janet M. ; Marshall, Paul ; Marshall, Cheryl
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
Flight and ground test Single Event Effect (SEE) data are presented on spacecraft systems and experiments utilizing three enabling technologies, a Fiber Optic Data Bus (FODB), a Solid State Recorder (SSR), and a power metal oxide semiconductor field effect transistor (MOSFET). Extended datasets on system and device performance from multiple NASA spacecraft and experiments, as well as design implications of flight results, are discussed
Keywords :
CMOS memory circuits; Hamming codes; SRAM chips; aerospace testing; fault diagnosis; optical fibre networks; power MOSFET; proton effects; radiation hardening (electronics); satellite communication; semiconductor device testing; space vehicle electronics; system buses; APEX experiment; CRUX experiment; Meteor-3 spacecraft; SAMPEX spacecraft; SEU; SRAM array; XTE spacecraft; burnout; design implications; device performance; enabling technology; error detection and correction; extended datasets; fiber optic data bus; flight test data; ground test data; in-flight analysis; multiple NASA spacecraft; power MOSFET; proton induced errors; single event effect data; solid state recorder; spacecraft systems; system performance; total ozone mapping spectrometer; FETs; MOSFET circuits; Optical fiber testing; Optical fibers; Power MOSFET; Semiconductor device testing; Solid state circuits; Space technology; Space vehicles; System testing;
Conference_Titel :
Aerospace Conference, 1997. Proceedings., IEEE
Conference_Location :
Snowmass at Aspen, CO
Print_ISBN :
0-7803-3741-7
DOI :
10.1109/AERO.1997.574887
