DocumentCode :
3074034
Title :
Phase equilibria of the Sn-Bi-Cu ternary system in advanced microelectronic packaging
Author :
Yee-Wen Yen ; Hsien-Ming Hsiao ; Gu-Jhong Jhang ; Han-Wei Shi ; Meng-Kuang Huang
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear :
2012
fDate :
24-26 Oct. 2012
Firstpage :
388
Lastpage :
391
Abstract :
The Sn-Bi solder is a very common lead-free solder used in electronic packaging due to its low eutectic temperature (138°C). Copper is generally used as the substrate in a printed circuit board (PBC) and a metallic pad in the integrated circuit (IC) fabrication. Cu is also used as the under-bump metallurgy (UBM) of the flip chip (FC) package. Thus, for reliability of a solder-joint, it is necessary to make a clear understanding of the phase equilibria in the the Sn-Bi-Cu ternary system. In this study, the isothermal sections of the Sn-Bi-Cu ternary system were experimentally established at 400 and 120°C. The experimental results indicated that no ternary intermetallic compounds were found at both 400 and 120°C in Sn-Bi-Cu ternary system. The isothermal sections of the Sn-Bi-Cu ternary system at 400 and 120°C consist of five single-phase areas, seven two-phase areas, and three tie-triangles, respectively. The Cu3Sn phase is in equilibrium with most stable single phases in these two isothermal sections. This phase should be the most stable phase in the Sn-Bi-Cu ternary system.
Keywords :
flip-chip devices; integrated circuit packaging; integrated circuit reliability; integrated circuits; microfabrication; printed circuits; solders; FC package; IC fabrication; PBC; UBM; advanced microelectronic packaging; flip chip package; integrated circuit fabrication; lead-free solder; low eutectic temperature; metallic pad; phase equilibria; printed circuit board; reliability; ternary system; under-bump metallurgy; Annealing; Bismuth; Educational institutions; Isothermal processes; Tin; X-ray scattering; Isothermal section; Sn-Bi-Cu ternary system; lead-free solder; phase equilibria;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4673-1635-4
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2012.6420287
Filename :
6420287
Link To Document :
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