DocumentCode
3074045
Title
Segmentation and analysis of the glomerular basement membrane using the split and merge method
Author
Kamenetsky, Ilya ; Rangayyan, Rangaraj M. ; Benediktsson, Hallgrimur
Author_Institution
Department of Electrical & Computer Engineering, Schulich School of Engineering, University of Calgary, AB, Canada T2N 1N4
fYear
2008
fDate
20-25 Aug. 2008
Firstpage
3064
Lastpage
3067
Abstract
Certain renal diseases are characterized by alterations in the thickness of the glomerular basement membrane (GBM), as visualized by images of biopsy samples obtained by using a transmission electron microscope (TEM). Abnormal thinning, thickening, or variation in thickness can occur in familial hematuria, diabetes mellitus, and Alport syndrome, respectively. We propose image processing methods for the segmentation and measurement of the GBM. The methods include the split and merge algorithm, morphological image processing, skeletonization, and statistical analysis of the width of the GBM. The proposed methods were applied to 34 TEM images of six patients. The mean and standard deviation of normal GBM were estimated to be 368 ± 177 nm; those of thin GBMs associated with familial hematuria were 216 ± 95 nm; and those of thick GBM due to diabetic nephropathy were 1094 ± 361 nm. Comparative analysis of the results of image processing with manual measurements by an experienced renal pathologist indicated low error in the range of 12 ± 9 nm.
Keywords
Biomembranes; Biopsy; Diabetes; Diseases; Image analysis; Image processing; Image segmentation; Statistical analysis; Transmission electron microscopy; Visualization; Algorithms; Automation; Biopsy; Databases, Factual; Diabetic Nephropathies; Glomerular Basement Membrane; Hematuria; Humans; Image Processing, Computer-Assisted; Kidney; Kidney Glomerulus; Microscopy, Electron, Transmission; Models, Statistical; Signal Processing, Computer-Assisted;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location
Vancouver, BC
ISSN
1557-170X
Print_ISBN
978-1-4244-1814-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2008.4649850
Filename
4649850
Link To Document