DocumentCode :
3074497
Title :
Sensitivity analysis of voltage dip computations using the TEF methods
Author :
Debs, A.S. ; Domínguez, F.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1990
fDate :
5-7 Dec 1990
Firstpage :
3031
Abstract :
The author previously (1989) demonstrated that the lowest voltage dip in a power system following a disturbance occurs when the system trajectory attains maximal transient potential energy. In this paper, the first-order sensitivity of this potential energy is derived and then extended to predict directly a margin for voltage dip stability. The benefit of this is the ability to predict a host of operating margins for a power system, such as generation levels, reactive power levels, and others that keep the system in a secure operating state following given disturbance contingencies. Studies done in a 39-bus system indicate that the voltage dip behaves in a nearly linear fashion for variations in the given network parameters. Even in the case of large variations in these parameters, the error produced by assuming a linear behavior is acceptable. The need for second-order sensitivity expressions is not seen, and they might be required only in some cases where improved accuracy is desired
Keywords :
power systems; sensitivity analysis; stability; transients; 39-bus system; first-order sensitivity; generation levels; maximal transient potential energy; operating margin prediction; reactive power levels; sensitivity analysis; transient energy function methods; voltage dip stability; Electronics packaging; Equations; Potential energy; Power system analysis computing; Power system stability; Power system transients; Sensitivity analysis; Time domain analysis; Transmission line matrix methods; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1990., Proceedings of the 29th IEEE Conference on
Conference_Location :
Honolulu, HI
Type :
conf
DOI :
10.1109/CDC.1990.203340
Filename :
203340
Link To Document :
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