DocumentCode :
3075033
Title :
Pinpointing the Subsystems Responsible for the Performance Deviations in a Load Test
Author :
Malik, Haroon ; Adams, Bram ; Hassan, Ahmed E.
Author_Institution :
Sch. of Comput., Queen´´s Univ., Kingston, ON, Canada
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
201
Lastpage :
210
Abstract :
Large scale systems (LSS) contain multiple subsystems that interact across multiple nodes in sometimes unforeseen and complicated ways. As a result, pinpointing the subsystems that are the source of performance degradation for a load test in LSS can be frustrating, and might take several hours or even days. This is due to the large volume of performance counter data collected such as CPU utilization, Disk I/O, memory consumption and network traffic, the limited operational knowledge of analysts about all subsystems of an LSS and the unavailability of up-to-date documentation in a LSS. We have developed a methodology that automatically ranks the subsystems according to the deviation of their performance in a load test. Our methodology uses performance counter data of a load test to craft performance signatures for the LSS subsystems. Pair-wise correlations among the performance signatures of subsystems within a load test are compared with the corresponding correlations in a baseline test to pinpoint the subsystems responsible for the performance violations. Case studies on load test data obtained from a large telecom system and that of an open source benchmark application show that our approach provides an accuracy of 79% and do not require any instrumentation or domain knowledge to operate.
Keywords :
large-scale systems; performance evaluation; program testing; craft performance signature; domain knowledge; large scale system; load test; open source benchmark; operational knowledge; pair wise correlation; performance deviation; user performance counter data; Correlation; Databases; Generators; Principal component analysis; Radiation detectors; Servers; Testing; Load Testing; Performance Counters; Pinpointing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on
Conference_Location :
San Jose, CA
ISSN :
1071-9458
Print_ISBN :
978-1-4244-9056-1
Electronic_ISBN :
1071-9458
Type :
conf
DOI :
10.1109/ISSRE.2010.43
Filename :
5635038
Link To Document :
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