DocumentCode :
3075060
Title :
Computer simulation of polysilicon piezoresistive pressure sensors
Author :
Xiaowei, Liu ; Xin, Li ; Wei, Wang ; Wang Xilian ; Wei, Che ; Zhenmao, Liu ; Maojun, Fan
Author_Institution :
Astronaut. Sch., Harbin Inst. of Technol., China
fYear :
1998
fDate :
1998
Firstpage :
891
Lastpage :
894
Abstract :
In this paper, the computer simulation of polysilicon piezoresistive pressure sensors is introduced. The stress distribution on Si pressure sensitive membrane is analyzed by the finite-element method (FEM). The arrangement of polysilicon resistors, the geometrical size of the rectangular membrane and the temperature effect on the sensitivity of the sensors are considered. Among the eight possible patterns, the best one is pattern 8 for its highest output under the same pressure. It is also found that the sensitivity of the sensor will increase with the increase of the longitude/width ratio of the membrane. The simulation results can be used for optimizing the sensor design
Keywords :
elemental semiconductors; finite element analysis; membranes; microsensors; piezoresistive devices; pressure sensors; semiconductor device models; silicon; thin film resistors; Si; Wheatstone bridge; computer simulation; finite-element method; geometrical size; longitude/width ratio; polysilicon piezoresistive pressure sensors; polysilicon resistors arrangement; polysilicon strain gauges; pressure sensitive membrane; rectangular membrane; sensitivity; sensor design optimisation; stress distribution; temperature effect; Biomembranes; Bridge circuits; Capacitive sensors; Computational modeling; Computer simulation; Mechanical sensors; Piezoresistance; Silicon; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
Type :
conf
DOI :
10.1109/ICSICT.1998.786503
Filename :
786503
Link To Document :
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