Title :
Extracting a polynomial ac FET model with thermal couplings from S-parameter measurements
Author :
Vuolevi, Joel ; Rahkonen, Timo
Author_Institution :
Dept. of Electr. Eng., Oulu Univ., Finland
Abstract :
To simulate the linearity properties of RF FET amplifiers operating at moderate signal levels, this paper extends small-signal FET modelling and characterization to include the effects of nonlinearities. Pulsed S-parameter measurements are employed to avoid the problem of self-heating and to characterise electro-thermal distortion mechanisms. The extracted nonlinear ac model can be used in Volterra analysis to gain an insight into distortion mechanisms
Keywords :
S-parameters; Volterra equations; microwave field effect transistors; microwave measurement; semiconductor device measurement; semiconductor device models; RF FET amplifiers; Volterra analysis; distortion mechanisms; electro-thermal distortion mechanisms; linearity properties; nonlinearities; polynomial ac FET model; pulsed S-parameter measurements; small-signal FET modelling; thermal couplings; FETs; Linearity; Nonlinear distortion; Polynomials; Pulse amplifiers; Pulse measurements; RF signals; Radio frequency; Radiofrequency amplifiers; Scattering parameters;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.921347
