• DocumentCode
    3075639
  • Title

    Prioritizing Mutation Operators Based on Importance Sampling

  • Author

    Sridharan, Mohan ; Namin, Akbar Siami

  • Author_Institution
    Comput. Sci. Dept., Texas Tech Univ., Lubbock, TX, USA
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    378
  • Lastpage
    387
  • Abstract
    Mutation testing is a fault-based testing technique for measuring the adequacy of a test suite. Test suites are assigned scores based on their ability to expose synthetic faults (i.e., mutants) generated by a range of well-defined mathematical operators. The test suites can then be augmented to expose the mutants that remain undetected and are not semantically equivalent to the original code. However, the mutation score can be increased superfluously by mutants that are easy to expose. In addition, it is infeasible to examine all the mutants generated by a large set of mutation operators. Existing approaches have therefore focused on determining the sufficient set of mutation operators and the set of equivalent mutants. Instead, this paper proposes a novel Bayesian approach that prioritizes operators whose mutants are likely to remain unexposed by the existing test suites. Probabilistic sampling methods are adapted to iteratively examine a subset of the available mutants and direct focus towards the more informative operators. Experimental results show that the proposed approach identifies more than 90% of the important operators by examining ? 20% of the available mutants, and causes a 6% increase in the importance measure of the selected mutants.
  • Keywords
    Bayes methods; importance sampling; program testing; software fault tolerance; Bayesian approach; fault-based testing technique; importance sampling; mutation operators; mutation testing; probabilistic sampling method; Entropy; Equations; Monte Carlo methods; Probabilistic logic; Probability distribution; Stochastic processes; Testing; Bayesian Reasoning; Importance Sampling; Mutation Testing; Testing Effectiveness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1071-9458
  • Print_ISBN
    978-1-4244-9056-1
  • Electronic_ISBN
    1071-9458
  • Type

    conf

  • DOI
    10.1109/ISSRE.2010.16
  • Filename
    5635074