DocumentCode
3075639
Title
Prioritizing Mutation Operators Based on Importance Sampling
Author
Sridharan, Mohan ; Namin, Akbar Siami
Author_Institution
Comput. Sci. Dept., Texas Tech Univ., Lubbock, TX, USA
fYear
2010
fDate
1-4 Nov. 2010
Firstpage
378
Lastpage
387
Abstract
Mutation testing is a fault-based testing technique for measuring the adequacy of a test suite. Test suites are assigned scores based on their ability to expose synthetic faults (i.e., mutants) generated by a range of well-defined mathematical operators. The test suites can then be augmented to expose the mutants that remain undetected and are not semantically equivalent to the original code. However, the mutation score can be increased superfluously by mutants that are easy to expose. In addition, it is infeasible to examine all the mutants generated by a large set of mutation operators. Existing approaches have therefore focused on determining the sufficient set of mutation operators and the set of equivalent mutants. Instead, this paper proposes a novel Bayesian approach that prioritizes operators whose mutants are likely to remain unexposed by the existing test suites. Probabilistic sampling methods are adapted to iteratively examine a subset of the available mutants and direct focus towards the more informative operators. Experimental results show that the proposed approach identifies more than 90% of the important operators by examining ? 20% of the available mutants, and causes a 6% increase in the importance measure of the selected mutants.
Keywords
Bayes methods; importance sampling; program testing; software fault tolerance; Bayesian approach; fault-based testing technique; importance sampling; mutation operators; mutation testing; probabilistic sampling method; Entropy; Equations; Monte Carlo methods; Probabilistic logic; Probability distribution; Stochastic processes; Testing; Bayesian Reasoning; Importance Sampling; Mutation Testing; Testing Effectiveness;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on
Conference_Location
San Jose, CA
ISSN
1071-9458
Print_ISBN
978-1-4244-9056-1
Electronic_ISBN
1071-9458
Type
conf
DOI
10.1109/ISSRE.2010.16
Filename
5635074
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