Title :
Precise measurement of far-field pattern for large Aeff-fiber
Author :
Saito, T. ; Yamamoto, Y. ; Hirano, M. ; Kawano, T. ; Tei, C. ; Koyano, Y. ; Sasaki, T.
Author_Institution :
Sumitomo Electr. Ind., Ltd., Yokohama, Japan
Abstract :
Precise measurement of far-field distribution is presented for fibers having enlarged Aeff. By employing newlyproposed method to align fiber end-face with ±10μm position accuracy, we demonstrate Aeff measurement with errors of 0.1%.
Keywords :
geometrical optics; optical fibres; position measurement; Aeff measurement; align fiber end-face; far-field distribution; far-field pattern; large Aeff-fiber; position accuracy; precise measurement; Accuracy; Adaptive optics; Measurement uncertainty; Optical fiber cables; Optical fiber communication; Optical fibers; Position measurement;
Conference_Titel :
Opto-Electronics and Communications Conference (OECC), 2012 17th
Conference_Location :
Busan
Print_ISBN :
978-1-4673-0976-9
Electronic_ISBN :
2166-8884
DOI :
10.1109/OECC.2012.6276446
