DocumentCode :
3076028
Title :
Designing in reliability with standard cells
Author :
Brown, Thornas H. ; Locke, Donald G. ; Daughton, William
Author_Institution :
NCR Microelectron., Colorado Springs, CO, USA
fYear :
1989
fDate :
22-26 May 1989
Firstpage :
1977
Abstract :
The authors show the advantages of using generic standard-cell data in qualifying a military product. They describe the proposed methodology used in qualifying ASIC (application-specific integrated circuit) standard-cell devices for military use. Reliability results of using standard cells and recommendations for qualifying military standard-cell products are presented. It is noted that this new approach to qualifying ASIC standard-cell library devices for a military environment allows new designs to be introduced at a minimal cost and insures reliability at the same time
Keywords :
application specific integrated circuits; cellular arrays; circuit reliability; military equipment; ASIC; cost; military product; reliability; standard cells; standard-cell library devices; Application specific integrated circuits; Libraries; Manufacturing; Microelectronics; Military standards; Performance evaluation; Qualifications; Silicon; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
Conference_Location :
Dayton, OH
Type :
conf
DOI :
10.1109/NAECON.1989.40489
Filename :
40489
Link To Document :
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