DocumentCode
3076561
Title
Current profiling for μm-class planar circuit patterns by fiber-edge magneto-optic probe
Author
Sato, T. ; Iwanami, M. ; Hoshino, S. ; Kishi, M. ; Tsuchiya, M.
Author_Institution
Association of Super-Advanced Electron. Technol., Tsukuba, Japan
fYear
2003
fDate
10-12 Sept. 2003
Firstpage
341
Lastpage
344
Abstract
Inversion method of Biot-Savart´s law has been successfully applied to one-dimensional current profiling for μm-class planar circuits. Indispensable is to use a fiber-edge magneto-optic probe of high spatial resolution and high DUT-accessibility.
Keywords
electric current measurement; fibre optic sensors; magneto-optical sensors; μm-class planar circuit patterns; DUT; current profiling; fiber-edge magneto-optic probe; inversion method of Biot-Savart law; Bandwidth; Frequency; Magnetic circuits; Magnetic field measurement; Magnetic heads; Optical fiber polarization; Optical imaging; Probes; SQUIDs; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Photonics, 2003. MWP 2003 Proceedings. International Topical Meeting on
Print_ISBN
0-7803-8691-4
Type
conf
DOI
10.1109/MWP.2003.1422914
Filename
1422914
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