DocumentCode :
3076589
Title :
An Industrial Investigation of Similarity Measures for Model-Based Test Case Selection
Author :
Hemmati, Hadi ; Briand, Lionel
Author_Institution :
Dept. of Inf., Univ. of Oslo, Oslo, Norway
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
141
Lastpage :
150
Abstract :
Applying model-based testing (MBT) in practice requires practical solutions for scaling up to large industrial systems. One challenge that we have faced while applying MBT was the generation of test suites that were too large to be practical, even for simple coverage criteria. The goal of test case selection techniques is to select a subset of the generated test suite that satisfies resource constraints while yielding a maximum fault detection rate. One interesting heuristic is to choose the most diverse test cases based on a pre-defined similarity measure. In this paper, we investigate and compare possible similarity functions to support similarity-based test selection in the context of state machine testing, which is the most common form of MBT. We apply the proposed similarity measures and a selection strategy based on genetic algorithms to an industrial software system. We compare their fault detection rate based on actual faults. The results show that applying Jaccard Index on test cases represented as a set of trigger-guards is the most cost-effective similarity measure. We also discuss the overall benefits of our test selection approach in terms of test execution savings.
Keywords :
fault diagnosis; finite state machines; genetic algorithms; program testing; set theory; Jaccard Index; cost effective similarity measure; fault detection rate; genetic algorithm; industrial software system; model based test case selection; similarity based test selection; state machine testing; test execution saving; trigger guard; Context; Encoding; Fault detection; Gallium; Hamming distance; Testing; Unified modeling language; Test case selection; UML state machine; genetic algorithms; model-based testing; similarity measure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on
Conference_Location :
San Jose, CA
ISSN :
1071-9458
Print_ISBN :
978-1-4244-9056-1
Electronic_ISBN :
1071-9458
Type :
conf
DOI :
10.1109/ISSRE.2010.9
Filename :
5635133
Link To Document :
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