Title :
An Advanced Real-Time Electro-Magnetic Simulator for power systems with a simultaneous state-space nodal solver
Author :
Dufour, Christian ; Mahseredjian, Jean ; Bélanger, Jean ; Naredo, José Luis
Author_Institution :
Opal-RT Technol., Montréal, QC, Canada
Abstract :
This paper presents a simulation method that combines state-space analysis with a nodal method for the simulation of electrical systems. This paper extends the concept of a discrete companion branch equivalent of the nodal approach to state-space described systems, and enables natural coupling between them. The flexible clustering of state-space described electrical subsystems into a nodal method has the following advantages: first, the nodal admittance matrix can be constrained in size while still permitting the solution of a switched network by nodal admittance matrix on-line triangularisation. Also, each group can have a precalculation of all internal modes (caused by switches, for example) within itself, an important feature for real-time applications. Secondly, the state-space formulation enables the use of higher-level discretization methods with L-stability properties. Finally, the approach enables the coupling of complex nodal-based models like FD-line into a state-space based solver. The method is implemented in a commercial real-time simulation software tool, the Advanced Real-Time Electro-Magnetic Simulator (ARTEMiS).
Keywords :
EMTP; matrix algebra; power system simulation; state-space methods; ARTEMiS; L-stability property; advanced real-time electro-magnetic simulator; electrical subsystems; electrical system simulation; higher-level discretization methods; nodal admittance matrix online triangularisation; power systems; state-space analysis; state-space nodal solver; switched network; Admittance; Approximation methods; EMTP; Equations; History; Mathematical model; Real time systems; ARTEMiS; EMTP; Real-Time Simulation; solvers; state-space; state-space nodal;
Conference_Titel :
Transmission and Distribution Conference and Exposition: Latin America (T&D-LA), 2010 IEEE/PES
Conference_Location :
Sao Paulo
Print_ISBN :
978-1-4577-0488-8
DOI :
10.1109/TDC-LA.2010.5762905