DocumentCode :
3076672
Title :
A 2-Phase Method for Validation of Matching Pair Property with Case Studies of Operating Systems
Author :
Gui, Kang ; Kothari, Suraj
Author_Institution :
Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
151
Lastpage :
160
Abstract :
Memory leaks, asymmetric synchronization, and several other defects are examples of violation of the matching pair (MP) property. The property involves matching between two types of events on every execution path. We present a practical method to validate the MP property for large software. The method is designed to address the validation challenges resulting from the cross-cutting semantics and presence of invisible control flow. The method has two phases: the macro analysis and the micro analysis. The macro analysis phase incorporates important notions of signature and matching pair graph (MPG). Signatures enable a decomposition of the problem into small independent instances for validation, each identified by a unique signature. The MPG(x) defines for each signature x a minimal set of functions to be analyzed for validating the instance given by signature x. The micro analysis phase produces the event traces on all relevant execution paths through the functions belonging to a MPG(x). A fast and accurate analysis of large software is possible because the macro analysis can exactly identify the functions that need to be analyzed and the micro analysis can efficiently compute all the relevant event traces. We demonstrate the method through case studies of the Xinu and the Linux kernels.
Keywords :
data flow analysis; operating system kernels; program verification; 2-phase matching pair property validation method; Linux; Xinu; cross cutting semantics; macro analysis; matching pair graph; micro analysis; operating system; Kernel; Linux; Optimization; Resource management; Semantics; Synchronization; Cross-cutting Semantics; Memory Leaks; Program Analysis; Synchronization; Validation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on
Conference_Location :
San Jose, CA
ISSN :
1071-9458
Print_ISBN :
978-1-4244-9056-1
Electronic_ISBN :
1071-9458
Type :
conf
DOI :
10.1109/ISSRE.2010.40
Filename :
5635138
Link To Document :
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