DocumentCode :
3077077
Title :
Single-trial analysis of the auditory N100 improves separation of normal and schizophrenia subjects
Author :
Iyer, Darshan ; Zouridakis, George
Author_Institution :
Departments of Engineering Technology, Computer Science, and Electrical and Computer Engineering, University of Houston, TX 77204-3058 USA
fYear :
2008
fDate :
20-25 Aug. 2008
Firstpage :
3840
Lastpage :
3843
Abstract :
The N100 component of the auditory evoked potential (EP) has been recently used to study sensory gating deficits in schizophrenia subjects compared to normal controls. Previously, we used selective averaging to show phase synchronization differences in brain activity between the two populations. In this study, we employed our recently developed iterative independent component analysis (iICA) procedure to measure single-trial EPs in the context of a double-stimulus paradigm. Using the amplitude and latency of the N100 components of the first and second stimuli responses obtained from iICA and four different classification algorithms we were able to accurately classify subjects with 100% sensitivity and 100% specificity. In contrast, the same amplitude and latency features computed from average EPs provided only 69% classification accuracy, with 63% sensitivity and 75% specificity, respectively. We conclude that inter-trial temporal variability plays a significant role in the well-known sensory gating deficits found in schizophrenia patients.
Keywords :
Band pass filters; Brain; Classification algorithms; Delay; IEEE members; Independent component analysis; Iterative algorithms; Iterative methods; Scalp; Testing; Algorithms; Case-Control Studies; Cerebral Cortex; Electroencephalography; Electrophysiology; Equipment Design; Evoked Potentials, Auditory; Humans; Models, Statistical; Principal Component Analysis; Scalp; Schizophrenia; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location :
Vancouver, BC
ISSN :
1557-170X
Print_ISBN :
978-1-4244-1814-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2008.4650047
Filename :
4650047
Link To Document :
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