DocumentCode :
3077127
Title :
Coping with Complexity of Testing Models for Real-Time Embedded Systems
Author :
Mitsching, Ralf ; Weise, Carsten ; Franke, Dominik ; Gerlitz, Thomas ; Kowalewski, Stefan
Author_Institution :
Embedded Software Lab., RWTH Aachen Univ., Aachen, Germany
fYear :
2011
fDate :
27-29 June 2011
Firstpage :
128
Lastpage :
135
Abstract :
Model based testing techniques are a breakthrough in the modern software development. The integration of state-of the-art tools to automatically generate and evaluate tests from a model of the software product allows reducing the effort of testing activities while maintaining quality. A major problem for model based techniques is however the effort and the timing for the model specification. In practice, modeling for test case generation will often happen during the test phase instead of the design phase, implying that there is a high time pressure within the modeling process. Model views can help to reduce the effort spent for the modeling. In our work, we will present an useful approach to views for timed testing models, thus reducing the complexity of the modeling process.
Keywords :
embedded systems; formal specification; program testing; software maintenance; software quality; model based testing; model specification; quality maintenance; real-time embedded systems; software development; software product; test case generation; testing model complexity; timed testing model; Automata; Clocks; Computer architecture; Embedded systems; Object oriented modeling; Semantics; Testing; Embedded Systems; Modelbased Testing; Timed Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Secure Software Integration & Reliability Improvement Companion (SSIRI-C), 2011 5th International Conference on
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4577-0781-0
Electronic_ISBN :
978-0-7695-4454-0
Type :
conf
DOI :
10.1109/SSIRI-C.2011.27
Filename :
6004514
Link To Document :
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