Title :
Pattern classification for finding facial growth abnormalities
Author :
Lakkshmanan, Ajanthaa ; Shri, A. Abirami ; Aruna, E.
Author_Institution :
Sch. of Comput. Sci. & Eng., VIT Univ., Vellore, India
Abstract :
Cephalometric analysis of lateral radiographs of the head is an important diagnosis tool in orthodontics. Based on actually locating precise landmarks, it is a tedious, long-lasting and error prone mission. The objective of this work is to calculate the SNA angle, SNB angle and ANB angle between the landmarks to identify the input and output parameters pertaining to skeletal abnormalities. By doing so the patients data for training and testing the back propagation neural network (BPNN), generalized regression neural network (GRNN), support vector machine (SVM) and extreme learning machine (ELM) classifiers by nine fold cross substantiation. The presentation of skeletal is originated out using the BPNN, GRNN, SVM and ELM models. This will be useful to identify whether the patient is normal or abnormal (need for treatment). This will categorize situation of the diverse patients with severity of abnormalities in skeletal.
Keywords :
diagnostic radiography; learning (artificial intelligence); medical image processing; neural nets; patient diagnosis; pattern classification; regression analysis; support vector machines; ANB angle; ELM; SNA angle; SNB angle; back propagation neural network; cephalometric analysis; diagnosis tool; error prone mission; extreme learning machine classifiers; facial growth abnormalities; generalized regression neural network; lateral radiographs; orthodontics; patients data; pattern classification; skeletal abnormalities; support vector machine; Analytical models; Cranial; Dentistry; Mathematical model; Neural networks; Support vector machines; Training; back propagation neural network (BPNN); extreme learning machine (ELM); generalized regression neural network (GRNN); support vector machine (SVM);
Conference_Titel :
Computational Intelligence and Computing Research (ICCIC), 2013 IEEE International Conference on
Conference_Location :
Enathi
Print_ISBN :
978-1-4799-1594-1
DOI :
10.1109/ICCIC.2013.6724126