Title :
Domain identification in impedance computed tomography by spline collocation method
Author_Institution :
NASA Langley Res. Center, Hampton, VA, USA
Abstract :
A method for estimating an unknown domain in elliptic boundary value problems is considered. The problem is formulated as an inverse problem of integral equations of the second kind. A computational method is developed using a splice collocation scheme. The results can be applied to the inverse problem of impedance computed tomography (ICT) for image reconstruction
Keywords :
boundary-value problems; computerised picture processing; integral equations; splines (mathematics); domain identification; elliptic boundary value problems; image reconstruction; impedance computed tomography; integral equations; inverse problem; spline collocation method; Computed tomography; Conductivity; Current density; Image reconstruction; Impedance; Integral equations; Inverse problems; Spline; Surface morphology; Voltage;
Conference_Titel :
Decision and Control, 1990., Proceedings of the 29th IEEE Conference on
Conference_Location :
Honolulu, HI
DOI :
10.1109/CDC.1990.203562
